The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 24, 2018
Filed:
Dec. 14, 2016
Heidelberger Druckmaschinen Ag, Heidelberg, DE;
Heidelberger Druckmaschinen AG, Heidelberg, DE;
Abstract
A method is provided for checking an image inspection system having a camera system with a camera, an illumination apparatus for targeted illumination of a printing substrate, an image processing computer, and a main computer, for quality control of products of a printing substrate processing machine by using the main computer. A reference image is entered and transmitted to the main computer, a current printing image recorded by the camera system is transmitted to the image processing computer, a partial image in a suitable region of the current printing image, not being printed with printing image data, is selected in the image processing computer, the partial image is analyzed by comparison with the reference image in the image processing computer, and the inspection system is assessed based on the analysis of the partial image by the main computer and any defects of the inspection system being found are indicated.