The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 24, 2018

Filed:

Apr. 28, 2015
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Kai CK Chen, Shanghai, CN;

Zhen Yu Ge, Shanghai, CN;

Adrian X. Rodriguez, Durham, NC (US);

Wen Wei Tang, Shanghai, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2017.01); G06T 7/70 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0008 (2013.01); G06T 7/70 (2017.01); G06K 9/00 (2013.01); G06T 2207/10004 (2013.01); G06T 2207/30141 (2013.01); G06T 2207/30148 (2013.01);
Abstract

The present embodiments disclose a method and apparatus for locating a unit in an assembly. According to the embodiments, a unit in an assembly is located. An identification of the target unit in the assembly is obtained. An image of at least a part of the assembly is acquired. The image includes a visual code associated with the part. The visual code is decoded to obtain an identification of at least one unit in the part. It is determined if the target unit is included in the part responsive to identification of a match of the target unit with the identification of the at least one unit. There is further disclosed a corresponding apparatus, assembly, and fault diagnosis device.


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