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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9953408 B1

PDFFull Text
Date of Patent:
Apr. 24, 2018

Filed:

Nov. 16, 2015

Methods for monitoring components

Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Jason Lee Burnside, Greenville, SC (US);

Gregory Lee Hovis, Martinez, GA (US);

William F. Ranson, Columbia, SC (US);

Robert William Davidoff, Greenville, SC (US);

Assignee:

GENERAL ELECTRIC COMPANY, Schenectady, NY (US);

Attorney:

Dority & Manning, P.A.

Primary Examiner:

Sheela C Chawan

Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/32 (2006.01); G06T 7/00 (2017.01); F01D 5/02 (2006.01); F01D 5/12 (2006.01); F01D 9/02 (2006.01); F01D 21/00 (2006.01); F01D 25/24 (2006.01); F04D 27/00 (2006.01); F04D 29/32 (2006.01); F04D 29/52 (2006.01); F04D 29/54 (2006.01); G06K 9/46 (2006.01); G06K 9/62 (2006.01); F01D 17/04 (2006.01); G01M 5/00 (2006.01); G01B 11/16 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); F01D 5/02 (2013.01); F01D 5/12 (2013.01); F01D 9/02 (2013.01); F01D 17/04 (2013.01); F01D 21/003 (2013.01); F01D 25/24 (2013.01); F04D 27/001 (2013.01); F04D 29/324 (2013.01); F04D 29/522 (2013.01); F04D 29/542 (2013.01); G01B 11/165 (2013.01); G01M 5/0016 (2013.01); G01M 5/0091 (2013.01); G06K 9/46 (2013.01); G06K 9/6202 (2013.01); G06K 9/6215 (2013.01); F05D 2220/31 (2013.01); F05D 2220/32 (2013.01); F05D 2270/332 (2013.01); F05D 2270/80 (2013.01); F05D 2270/808 (2013.01); F05D 2270/821 (2013.01); G06T 2207/30164 (2013.01);
Abstract

Methods for monitoring components are provided. A component has an exterior surface. A method includes locating a centroid of a reference feature configured on the component, and measuring a first value of a characteristic of the reference feature relative to the centroid at a first time. The method further includes measuring a second value of the characteristic relative to the centroid at a second time after the first time, and comparing the first value and the second value.

Find Patent Forward Citations

Burnside, Jason. (2018). Methods for monitoring components (U.S. Patent No. 9953408). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9953408

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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