The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 24, 2018

Filed:

Aug. 05, 2014
Applicant:

California Institute of Technology, Pasadena, CA (US);

Inventors:

Yaser Said Abu-Mostafa, Pasadena, CA (US);

Carlos Roberto Gonzalez, Pasadena, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/18 (2006.01); G06N 99/00 (2010.01); G06N 5/02 (2006.01); G06K 9/62 (2006.01); G06N 7/00 (2006.01);
U.S. Cl.
CPC ...
G06N 99/005 (2013.01); G06K 9/6223 (2013.01); G06K 9/6256 (2013.01); G06N 5/025 (2013.01); G06N 7/005 (2013.01);
Abstract

Technologies are generally described for systems, devices and methods relating to determining weights in a machine learning environment. In some examples, a training distribution of training data may be identified, information about a test distribution of test data, and a coordinate of the training data and the test data may be identified. Differences between the test distribution and the training distribution may be determined, for the coordinate. A weight importance parameter may be identified, for the coordinate. A processor may calculate weights based on the differences, and based on the weight importance parameter. The weights may be adapted to cause the training distribution to conform to the test distribution at a degree of conformance. The degree of conformance may be based on the weight importance parameter.


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