The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 24, 2018
Filed:
Dec. 16, 2015
The Board of Trustees of the Leland Stanford Junior University, Stanford, CA (US);
David Lobell, Stanford, CA (US);
The Board of Trustees of the Leland Stanford Junior University, Standford, CA (US);
Abstract
Systems and methods for generating a crop yield estimate for an area as small as an individual field from images captured by a satellite are disclosed. The system generates simulations of crop yields in a region that includes the area by applying combinations of different parameters to a crop yield models. Observable quantities for simulated yields are determined from the simulations. The simulations and the observable properties are used to train a statistic model for the region that has two or more variables. Images captured by a satellite that include at least a portion of the area are obtained. Crop information is then determined from the images and weather information associated with the dates that the images where captured is obtained. The statistical model is then applied to the crop information and the weather information to determine a crop yield estimate.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile