The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 24, 2018

Filed:

Aug. 13, 2015
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Nahyup Kang, Seoul, KR;

Jiyeon Kim, Hwaseong-si, KR;

Hyong-euk Lee, Suwon-si, KR;

Hwiryong Jung, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06G 7/48 (2006.01); G06F 17/50 (2006.01); G06F 17/10 (2006.01);
U.S. Cl.
CPC ...
G06F 17/50 (2013.01); G06F 17/10 (2013.01); G06F 17/5009 (2013.01); G06F 2217/16 (2013.01);
Abstract

Provided is a method and apparatus for modeling objects that may include detecting an adjacent area that shares modeled particles of a first object and modeled particles of a second object, calculating an action force between the first object and the second object in the adjacent area based on information stored for grid points of a grid defined with respect to the adjacent area, and modelling the first object and the second object based on the calculated action force.


Find Patent Forward Citations

Kang, Nahyup. (2018). Object modeling method and apparatus (U.S. Patent No. 9953109). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9953109

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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