The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 24, 2018

Filed:

Dec. 27, 2012
Applicant:

Emc Corporation, Hopkinton, MA (US);

Inventors:

David Stephen Reiner, Lexington, MA (US);

Lintao Wan, Shanghai, CN;

Qiyan Chen, Shanghai, CN;

Tianqing Wang, Shanghai, CN;

Feng Golfen Guo, Shanghai, CN;

Dong Xiang, Shanghai, CN;

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06N 99/00 (2010.01);
U.S. Cl.
CPC ...
G06F 17/30598 (2013.01); G06N 99/005 (2013.01);
Abstract

A data classification system is associated with a hybrid cloud comprising at least one private cloud and at least one public cloud. The data classification system comprises a data set classification model classifying data sets, a cloud classification model classifying the private and public clouds of the hybrid cloud, and mapping policies each specifying a particular mapping between one or more classes of the data set classification model and one or more classes of the cloud classification model. The data classification system classifies a received data set using the data set classification model, and determines for the received data set at least one cloud of the hybrid cloud to which the received data set should be directed for further processing based at least in part on a result of the classification of the received data set, the cloud classification model and a selected one of the mapping policies.


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