The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 24, 2018
Filed:
Dec. 24, 2014
Samsung Sds Co., Ltd., Seoul, KR;
SAMSUNG SDS CO., LTD., Seoul, KR;
Abstract
Provided are a system and method for detecting and predicting anomalies based on analysis of time-series data. According to an embodiment of the present disclosure, an abnormality detecting and predicting system includes a database configured to store past case data related to a state of a monitored object; a data collector configured to collect time-series status information of the monitored object; an abnormality detector configured to compare the status information with an abnormality detecting reference in a preset detecting interval and detect an occurrence of an abnormality of the monitored object; a similar case selector configured to select a similar case having a highest degree of similarity to the status information among the past case data when the occurrence of an abnormality is detected by the abnormality detector; and a predictor configured to predict proliferation or diminishing of a detected abnormality using the similar case and an abnormality proliferation predicting reference.