The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 24, 2018

Filed:

Jul. 19, 2012
Applicants:

Heiner Markert, Stuttgart, DE;

Thomas Kruse, Stuttgart, DE;

Volker Imhof, Kornwestheim, DE;

Thorsten Huber, Gerlingen, DE;

Rene Diener, Ludwigsburg, DE;

Ernst Kloppenburg, Ditzingen, DE;

Felix Streichert, Yokohama, JP;

Holger Ulmer, Ulm, DE;

Stefan Angermaier, Stuttgart, DE;

Inventors:

Heiner Markert, Stuttgart, DE;

Thomas Kruse, Stuttgart, DE;

Volker Imhof, Kornwestheim, DE;

Thorsten Huber, Gerlingen, DE;

Rene Diener, Ludwigsburg, DE;

Ernst Kloppenburg, Ditzingen, DE;

Felix Streichert, Yokohama, JP;

Holger Ulmer, Ulm, DE;

Stefan Angermaier, Stuttgart, DE;

Assignee:

ROBERT BOSCH GMBH, Stuttgart, DE;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/60 (2006.01); G06F 17/10 (2006.01); G06F 17/50 (2006.01); G05B 13/04 (2006.01); G06N 7/00 (2006.01);
U.S. Cl.
CPC ...
G05B 13/04 (2013.01); G06F 17/5009 (2013.01); G06F 17/5045 (2013.01); G06N 7/005 (2013.01);
Abstract

A method is provided for populating a function for a control unit with data, in which method measurements are performed on a system at different measuring points on a test stand, and a global data-based model is set up based on the obtained measured values, and virtual measurements which simulate real measurements on the test stand are carried out on the global data-based model, and uncertainties for virtual measured values of the virtual measurements are determined from the global data-based model, the uncertainties of the virtual measured values being taken into account when populating the function for the control unit with data.


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