The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 24, 2018
Filed:
Feb. 04, 2016
Stichting VU, Amsterdam, NL;
Andreas Sebastian Biebricher, Amsterdam, DE;
Andrea Candelli, Amsterdam, IT;
Iddo Heller, Amsterdam, NL;
Niels Laurens, Amsterdam, NL;
Erwin Johannes Gerard Peterman, Amsterdam, NL;
Gijs Jan Lodewijk Wuite, Amsterdam, NL;
Stichting VU, Amsterdam, NL;
Abstract
The present disclosure relates to an apparatus () and method for controlling a plurality of simultaneously active optical traps (OT,OT,OT). In one method, trapping beams (TB,TB,TB) are provided and redirected for individually controlling a respective position (X,Y) of optical traps (OT,OT,OT) formed by focusing of the redirected trapping beams in a sample volume (SV). Light (L,L) from the sample volume (SV) corresponding to the optical traps is received. A path of a detector beam (AB) is overlapped with one of the trapping beams (TB), wherein the detector beam has a distinct wavelength (λA) from that of the overlapping trapping beam (TB). In one channel, the light from the sample volume is filtered according to wavelength, and only the filtered light having the wavelength (λA) of the detector beam (AB) is measured.