The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 24, 2018
Filed:
Nov. 26, 2013
Lein Applied Diagnostics Limited, Wokingham Berkshire, GB;
Robin Taylor, Purley-on-Thames, GB;
James Reynolds, Rodborough, GB;
Simon Meadowcroft, Stowmarket, GB;
Lein Applied Diagnostics Limited, Wokingham Berkshire, GB;
Abstract
An optical measurement apparatus () containing a bidirectional optical transceiver component (), the bidirectonal optical transceiver component () comprising a source of optical electromagnetic radiation (), an optical detector (), a beamsplitter, and a combined input and output port (). The port () is arranged to permit, when in use, propagation of optical electromagnetic radiation therethrough. The beamsplitter is aligned within a housing () with respect to the optical source (), the optical detector () and the port () in order to direct optical electromagnetic radiation emitted by the optical source () to the port () and to direct optical electromagnetic radiation received from the port () to the optical detector ().