The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 24, 2018

Filed:

Jul. 04, 2013
Applicant:

Nvidia Corporation, Santa Clara, CA (US);

Inventors:

Varghese George, Walnut Creek, CA (US);

Rubil Ahmadi, Sunnyvale, CA (US);

Jesse Guss, Menlo Park, CA (US);

Assignee:

NVIDIA Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 29/00 (2006.01); G01R 29/26 (2006.01); G01R 31/317 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31709 (2013.01); G01R 31/31727 (2013.01);
Abstract

Disclosed are a method, system, and/or apparatus to perform clock jitter and power supply noise analysis. In one embodiment, a method may include receiving a first signal, which may be a clock signal, then generating a second signal based on the first signal. The method may further include delaying the second signal by a base delay and/or a series of fine delays. The method may also include taking measurements of the delayed second signal and comparing those measurements to theoretical measurements of the second signal that would occur if the first signal were noise-free. The method may further include determining, based on the measurements and the comparison thereof, whether noise is present, whether the noise is high frequency or low frequency noise, and whether the noise is due to clock jitter and/or power supply deviations.


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