Remote test management of digital logic circuits

Abstract

Electronic devices () are provided which comprise a digital logic circuit () and a test module () adapted to receive test parameters from a remote test management device (), generate test patterns based on the test parameters, apply the test patterns to the digital logic circuit, receive test responses from the digital logic circuit, compact the test responses into a test signature, and either transmit the test signature to the remote test management device or determine a test result based on a comparison of an expected signature received from the remote test management device with the test signature. Further provided are remote test management devices comprising means adapted to acquire test parameters suitable for generating test patterns for a digital logic circuit, acquire an expected signature corresponding to the test patterns, transmit the test parameters to at least one electronic device comprising the digital logic circuit, and either receive a test signature from the at least one electronic device and determine a test result based on a comparison of the expected signature with the test signature, or transmit the expected signature to the at least one electronic device.