The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 24, 2018

Filed:

Jul. 02, 2015
Applicant:

Azbil Corporation, Tokyo, JP;

Inventor:

Tatsuya Ueno, Tokyo, JP;

Assignee:

AZBIL CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01P 3/36 (2006.01); G01S 17/58 (2006.01); G01S 7/491 (2006.01); G01S 17/32 (2006.01);
U.S. Cl.
CPC ...
G01P 3/36 (2013.01); G01S 7/4916 (2013.01); G01S 17/58 (2013.01); G01S 17/325 (2013.01);
Abstract

A velocity deviation measuring device includes: a laser driver that causes a semiconductor laser to oscillate; a counting portion that counts run lengths of binary signals wherein interference waveforms included in the output of a photodiode that converts the output of the semiconductor laser into an electric signal have been binarized; and a calculating portion that calculates the deviation in the surface velocity of a web from the counting result by the counting portion. The counting portion binarizes the interference waveform synchronized to a sampling clock, measures the respective run lengths of the binary signal during a reference interval and a comparison interval, creates respective frequency distributions of the run lengths for the reference interval and the comparison interval, and calculates, respectively, for the reference interval and the comparison interval, the total numbers of run lengths that are at or above a threshold value Th, from the frequency distribution.


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