The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 24, 2018

Filed:

Jan. 11, 2012
Applicants:

Wilhelm Satzger, Munich, DE;

Siegfried Sikorski, Munich, DE;

Karl-heinz Dusel, Unterschleissheim, DE;

Wilhelm Meir, Gablingen, DE;

Bertram Kopperger, Dachau, DE;

Josef Waermann, Viehbach, DE;

Andreas Jakimov, Munich, DE;

Manuel Hertter, Munich, DE;

Hans-christian Melzer, Jetzendorf, DE;

Thomas Hess, Munich, DE;

Inventors:

Wilhelm Satzger, Munich, DE;

Siegfried Sikorski, Munich, DE;

Karl-Heinz Dusel, Unterschleissheim, DE;

Wilhelm Meir, Gablingen, DE;

Bertram Kopperger, Dachau, DE;

Josef Waermann, Viehbach, DE;

Andreas Jakimov, Munich, DE;

Manuel Hertter, Munich, DE;

Hans-Christian Melzer, Jetzendorf, DE;

Thomas Hess, Munich, DE;

Assignee:

MTU AERO ENGINES AG, Munich, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2006.01); B22F 3/105 (2006.01); B29C 67/00 (2017.01); B33Y 40/00 (2015.01); G01N 25/72 (2006.01);
U.S. Cl.
CPC ...
G01N 35/00 (2013.01); B22F 3/105 (2013.01); B22F 3/1055 (2013.01); B29C 67/0077 (2013.01); B29C 67/0085 (2013.01); B29C 67/0088 (2013.01); B22F 2003/1056 (2013.01); B22F 2003/1057 (2013.01); B33Y 40/00 (2014.12); G01N 25/72 (2013.01); Y02P 10/295 (2015.11);
Abstract

Disclosed is a method for monitoring a generative fabrication process in which a component is formed in an installation space from a multiplicity of layers by using a three-dimensional data model and a following layer is fixed to a preceding layer by means of a high-energy beam. The method comprises detecting the component at least optically and detecting the installation space thermally during layer application. Also disclosed is a device for carrying out the method.


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