The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 24, 2018
Filed:
Jul. 02, 2015
Antoine Delhomme, Versailles, FR;
Benoit Lepage, Quebec, CA;
Antoine Delhomme, Versailles, FR;
Benoit Lepage, Quebec, CA;
Olympus Scientific Solutions America, Waltham, MA (US);
Abstract
The method of validating a calibration of a phased-array inspection instrument uses a calibration block having two reflectors located below an inspection surface at two different depths. The method comprises: obtaining angle reference data associating expected angles with corrected angles, each corrected angle being usable to propagate a phased-array beam into the calibration block at a true angle relative to the inspection surface that corresponds to the corresponding expected angle; propagating, from the inspection surface and targeting each one of the two reflectors, phased-array beams into the calibration block at a true angle using the angle reference data, and measuring echo signals associated with the propagated phased-array beams; determining time-of-flight values corresponding to the reflection of the phased-array beams on the two reflectors using the echo signals; and validating the calibration of the phased-array inspection instrument using the time-of-flight values, the two different depths and the true angle.