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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9952179 B1

PDFFull Text
Date of Patent:
Apr. 24, 2018

Filed:

Mar. 24, 2015

System and method for trace detection using dual ionization sources

Applicant:

Rapsican Systems, Inc., Torrance, CA (US);

Inventors:

Andrey N. Vilkov, Aliso Viejo, CA (US);

Jack A. Syage, Corona del Mar, CA (US);

Assignee:

Rapiscan Systems, Inc., Torrance, CA (US);

Attorney:

Novel IP

Primary Examiner:

Andrew Smyth

Int. Cl.
CPC ...
H01J 27/00 (2006.01); G01N 27/62 (2006.01); H01J 37/08 (2006.01); H01J 49/10 (2006.01); G01N 33/22 (2006.01); G01N 33/00 (2006.01);
U.S. Cl.
CPC ...
G01N 27/622 (2013.01); G01N 33/0036 (2013.01); G01N 33/227 (2013.01); H01J 37/08 (2013.01); H01J 49/107 (2013.01);
Abstract

A dual source ionizer includes a first ionization source and a second ionization source. The first ionization source is configured to generate a first electric field. The first electric field has a first field strength that is insufficient to form NOions. The second ionization source is configured to generate a second electric field. The second electric field has a second field strength that is sufficient to form ozone and the NOions.

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Vilkov, Andrey. (2018). System and method for trace detection using dual ionization sources (U.S. Patent No. 9952179). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9952179

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