The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 24, 2018
Filed:
Oct. 13, 2015
Samsung Electronics Co., Ltd., Suwon-si, KR;
Industry-academic Cooperation Foundation, Yonsei University, Seoul, KR;
Sang Uk Son, Yongin-Si, KR;
Duck Hwan Kim, Goyang-Si, KR;
In Sang Song, Osan-Si, KR;
Seong Chan Jun, Seoul, KR;
Ho Soo Park, Yongin-si, KR;
Jea Shik Shin, Hwaseong-si, KR;
Moon Chul Lee, Seongnam-si, KR;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Industry-Academic Cooperation Foundation, Yonsei University, Seoul, KR;
Abstract
A method of measuring biological sample properties and a biological sample property measuring apparatus is provided. A method of measuring biological sample properties includes disposing a biomaterial to contact a sensing unit, detecting a radio frequency (RF) signal flowing through the sensing unit, and obtaining an RF property indicator of the biomaterial based on the detected RF signal.