The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 24, 2018
Filed:
Dec. 21, 2012
Applicant:
General Electric Company, Schenectady, NY (US);
Inventors:
Uwe Wiedmann, Niskayuna, NY (US);
Daniel David Harrison, Niskayuna, NY (US);
Assignee:
GENERAL ELECTRIC COMPANY, Schenectady, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/06 (2018.01); G01N 23/083 (2018.01); G01N 23/04 (2018.01);
U.S. Cl.
CPC ...
G01N 23/046 (2013.01); G01N 23/06 (2013.01); G01N 23/083 (2013.01); G01N 2223/419 (2013.01); G01N 2223/423 (2013.01); G01N 2223/612 (2013.01);
Abstract
Various of the disclosed embodiments contemplate systems and methods that compensate for the limited dynamic range of certain X-Ray detector systems, such as CAT-Scan detector systems. In some embodiments, the system alternates between different photon emission flux values and then gives more consideration to an attenuation value associated with a more favorable detection flux. In this manner, different object densities may be accounted for and may be more properly imaged despite the particular characteristics of the X-Ray system.