The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 24, 2018

Filed:

Jan. 10, 2017
Applicant:

The Charles Stark Draper Laboratory, Inc., Cambridge, MA (US);

Inventors:

Matthew A. Sinclair, Stoneham, MA (US);

Adam Kelsey, Newton, MA (US);

Richard E. Stoner, Framingham, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); G21K 1/00 (2006.01); G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6404 (2013.01); G01B 9/02015 (2013.01); G01N 21/645 (2013.01); G21K 1/006 (2013.01); G01B 2290/55 (2013.01); G01N 2021/6463 (2013.01); G01N 2201/06113 (2013.01);
Abstract

An atomic interferometer and methods for measuring phase shifts in interference fringes using the same. The atomic interferometer has a laser beam traversing an ensemble of atoms along a first path and an optical components train with at least one alignment-insensitive beam routing element configured to reflect the laser beam along a second path that is anti-parallel with respect to the first laser beam path. Any excursion from parallelism of the second beam path with respect to the first is rigorously independent of variation of the first laser beam path in yaw parallel to an underlying plane.


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