The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 24, 2018
Filed:
Feb. 03, 2016
National Central University, Taoyuan, TW;
Tsung-Hsun Yang, Taoyuan, TW;
Ching-Cherng Sun, Taoyuan, TW;
Yeh-Wei Yu, Taoyuan, TW;
Chao-Chuan Chen, Taoyuan, TW;
NATIONAL CENTRAL UNIVERSITY, Taoyuan, TW;
Abstract
The present invention discloses an optic distribution meter that includes a testing system and an imaging system. The testing system includes an arc-shaped brace which has an extended object holder; and a rail base which has a first rail. The imaging system, set at a side of the testing system, includes a screen and an image catcher. With the implementation of the present invention, the rail base is able to rotate or move an object to a test angle with very little light blocking of measurements. Besides, with the first rail supporting the object, the incident angle of the light of a light source to the object remains unchanged when the measuring angle of the imaging system is changed. Thus ensure the accuracy of measurements of the optic distribution meter.