The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 24, 2018

Filed:

Sep. 12, 2016
Applicant:

Thermo Electron Scientific Instruments Llc, Madison, WI (US);

Inventors:

Damian W. Ashmead, Middletown, DE (US);

James V. Howard, Madison, WI (US);

Kevin K. Kim, Madison, WI (US);

Andrew Martin Braasch, Fitchburg, WI (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/01 (2006.01); G01N 21/03 (2006.01); G01N 21/27 (2006.01); G01R 33/07 (2006.01); G01R 33/09 (2006.01); G01N 21/31 (2006.01); G01D 5/14 (2006.01);
U.S. Cl.
CPC ...
G01N 21/0303 (2013.01); G01N 21/27 (2013.01); G01N 21/31 (2013.01); G01R 33/07 (2013.01); G01R 33/093 (2013.01); G01D 5/145 (2013.01); G01N 2021/035 (2013.01); G01N 2021/036 (2013.01); G01N 2201/0668 (2013.01); G01N 2201/08 (2013.01);
Abstract

An apparatus includes a first pedestal surface coupled to i) a swing arm and to ii) a light source. The apparatus further includes a magnet, a base plate, a mechanical stop coupled to the base plate, and a second pedestal surface mechanically coupled to said base plate and configured to receive a liquid sample, said second pedestal surface being coupled to a spectrometer. The apparatus further includes a magnetic flux sensor located between north and south magnetic flux fields of the magnet such that the magnetic flux reaching the sensor while the mechanical stop is in physical contact with the swing arm provides a linear range of output of the magnetic flux sensor, and a processor adapted to calibrate the point for minimum optical path length using a threshold magnetic flux field emitted from the magnet and detected by the magnetic flux sensor.


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