The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 24, 2018

Filed:

Jun. 03, 2013
Applicant:

President and Fellows of Harvard College, Cambridge, MA (US);

Inventors:

Mikhail A. Kats, Cambridge, MA (US);

Romain Blanchard, Cambridge, MA (US);

Patrice Genevet, Cambridge, MA (US);

Federico Capasso, Cambridge, MA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/02 (2006.01); G01J 3/12 (2006.01); G01J 3/26 (2006.01); G01J 3/28 (2006.01); G02B 5/20 (2006.01); G02B 5/22 (2006.01); G02B 5/28 (2006.01); H01L 31/0216 (2014.01); H01L 31/0232 (2014.01);
U.S. Cl.
CPC ...
G01J 3/0205 (2013.01); G01J 3/021 (2013.01); G01J 3/0208 (2013.01); G01J 3/0218 (2013.01); G01J 3/26 (2013.01); G01J 3/2803 (2013.01); G02B 5/207 (2013.01); G02B 5/22 (2013.01); G02B 5/223 (2013.01); G02B 5/286 (2013.01); H01L 31/02162 (2013.01); H01L 31/02168 (2013.01); H01L 31/02325 (2013.01); G01J 2003/1213 (2013.01); Y02E 10/50 (2013.01);
Abstract

A spectral encoder includes a thin layer of lossy dielectric material whose thickness varies transversely from 0 to a thickness of about λ/4n (e.g., <100 nm), where λ is the wavelength of incident radiation and n is the dielectric material's refractive index. The dielectric layer reflects (and/or transmits) light at a wavelength that depends on the layer's thickness. Because the dielectric layer's thickness varies, different parts of the dielectric layer may reflect (transmit) light at different wavelengths. For instance, shining white light on a dielectric layer with a linearly varying thickness may produce a rainbow-like reflected (and/or transmitted) beam. Thus, the spectral encoder maps different wavelengths to different points in space. This mapping can be characterized by a transfer matrix which can be used to determine the spectrum of radiation incident on the spectral encoder from the spatial intensity distribution of the radiation reflected (and/or transmitted) by the spectral encoder.


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