The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 24, 2018
Filed:
Jan. 12, 2017
Trimble Ab, Danderyd, SE;
Mikael Nordenfelt, Vallentuna, SE;
Mikael Hertzman, Sollentuna, SE;
Trimble AB, Danderyd, SE;
Abstract
The present disclosure relates to a measuring instrument and a method implemented in such a measuring instrument. The measuring instrument includes an image sensor, an actuator, a control unit and a processor. The actuator is arranged to move a field of view of the image sensor. The control unit is configured to cause the image sensor to capture at least one digital image during motion of the field of view of the image sensor by the actuator. The exposure time for capturing the digital image is longer than an identifiable section of a regulating pattern for modulation of an optical radiation either emitted or reflected by at least one target. The processor is configured to process at least a portion of the captured image for detecting in the at least one portion the identifiable section of the regulating pattern. Such a measuring instrument is advantageous for detecting and/or identifying a target in the vicinity of the instrument.