The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 24, 2018

Filed:

Jul. 27, 2011
Applicants:

Kenichi Nagata, Ibaraki, JP;

Nobuhito Makino, Ibaraki, JP;

Inventors:

Kenichi Nagata, Ibaraki, JP;

Nobuhito Makino, Ibaraki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C23C 14/00 (2006.01); C23C 14/34 (2006.01); C21D 1/74 (2006.01); C21D 3/06 (2006.01); C22C 14/00 (2006.01); C22F 1/00 (2006.01); C22F 1/18 (2006.01); C22C 27/02 (2006.01); H01J 37/34 (2006.01);
U.S. Cl.
CPC ...
C23C 14/34 (2013.01); C21D 1/74 (2013.01); C21D 3/06 (2013.01); C22C 14/00 (2013.01); C22C 27/02 (2013.01); C22F 1/00 (2013.01); C22F 1/18 (2013.01); C22F 1/183 (2013.01); C23C 14/3414 (2013.01); C23C 14/3471 (2013.01); H01J 37/3426 (2013.01); H01J 37/3464 (2013.01); H01J 37/3491 (2013.01); H01J 37/3497 (2013.01); Y10T 29/49865 (2015.01);
Abstract

Provided is a sputtering target and/or a coil disposed at the periphery of a plasma-generating region for confining plasma. The target and/or the coil has a surface to be eroded having a hydrogen content of 500 μL/cmor less. In dealing with reduction in the hydrogen content of the surface of the target and/or the coil, the process of producing the target and/or the coil, in particular, the conditions for heating the surface of the target and/or the coil, which is thought to be cause of hydrogen occlusion, are appropriately regulated. As a result, hydrogen occlusion at the surface of the target can be reduced, and the degree of vacuum during sputtering can be improved. Thus, the present invention provides a target and/or a coil that has a uniform and fine structure, makes plasma stable, and allows a film to be formed with excellent uniformity and provides a method of producing the target and/or the coil.


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