The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 24, 2018
Filed:
Dec. 17, 2016
Sourabh Kumar Saha, Livermore, CA (US);
Martin Luther Culpepper, Georgetown, MA (US);
Sourabh Kumar Saha, Livermore, CA (US);
Martin Luther Culpepper, Georgetown, MA (US);
Other;
Abstract
Wrinkling of supported thin films is a strain-driven phenomenon that enables scalable and low-cost fabrication of periodic micro and nano scale structures. The morphology of wrinkles depends on both the magnitude and the nature of compressive strains that are applied to the thin film. This disclosure presents the methods to fabricate asymmetric 2-D wrinkled structures using biaxial compressive strains. The method relies on the dependence of wrinkle morphology on both strains and strain paths to generate asymmetric 2D wrinkles. Asymmetry is achieved by deliberately traversing the system through a strain state that creates cracks along a preferential direction. Fabricated patterns include non-uniform zigzag wrinkles that demonstrate period doubling only along one direction.