The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 24, 2018
Filed:
Sep. 19, 2014
Applicant:
Emc Corporation, Hopkinton, MA (US);
Inventors:
Brian J. Mello, Tewksbury, MA (US);
Robert Walter McFadries, Ashburnham, MA (US);
Assignee:
EMC IP Holding Company LLC, Hopkinton, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23K 26/362 (2014.01); B23K 26/03 (2006.01); B23K 26/04 (2014.01); B23K 26/36 (2014.01); G05B 19/18 (2006.01);
U.S. Cl.
CPC ...
B23K 26/032 (2013.01); B23K 26/041 (2013.01); B23K 26/365 (2013.01); G05B 19/182 (2013.01); G05B 2219/45041 (2013.01);
Abstract
An improved technique for calibrating the location of an individualized marking includes marking both a grid and an image on a calibration object. The technique uses the marked grid to measure the distance in two orthogonal directions from the current image location to the desired image location by counting the number of grids between the current image location to the desired image location.