The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 24, 2018
Filed:
Sep. 15, 2016
Lockheed Martin Corporation, Bethesda, MD (US);
Richard C. Vanhall, Owego, NY (US);
Adam L. Jung, Owego, NY (US);
LOCKHEED MARTIN CORPORATION, Bethesda, MD (US);
Abstract
The present disclosure is directed to systems and methods for warp and shear detection and correction and, more particularly, to systems and methods for detecting and correcting shear and warp in an address block of a mailpiece. The method is implemented in a computing device and includes: locating a barcode which is spatially consistent with a block of text; obtaining barcode bar data from the barcode which correlates to a difference in spatial orientation of one or more bars of the barcode with respect to a best fit line through the barcode; and replacing the block of text with a non-distorted block of text which can be read by optical character recognition processes, based on the barcode bar data.