The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 24, 2018

Filed:

Jan. 27, 2016
Applicant:

Accuray Incorporated, Sunnyvale, CA (US);

Inventors:

Jonathan Cecil Chappelow, Campbell, CA (US);

Petr Jordan, Redwood City, CA (US);

Calvin Maurer, San Jose, CA (US);

Sarbjit Singh, San Jose, CA (US);

Andrew W. Fitting, Fremont, CA (US);

Andriy Myronenko, San Mateo, CA (US);

Jian Gao, San Jose, CA (US);

Assignee:

ACCURAY INCORPORATED, Sunnyvale, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61N 5/10 (2006.01); G06K 9/62 (2006.01); G06T 5/00 (2006.01); G06T 7/00 (2017.01); G21K 1/04 (2006.01); H04N 5/225 (2006.01); G06T 7/73 (2017.01);
U.S. Cl.
CPC ...
A61N 5/1048 (2013.01); A61N 5/1045 (2013.01); A61N 5/1067 (2013.01); G06K 9/6211 (2013.01); G06T 5/006 (2013.01); G06T 7/74 (2017.01); G21K 1/046 (2013.01); H04N 5/2252 (2013.01); H04N 5/2257 (2013.01); G06T 2207/20048 (2013.01); G06T 2207/30164 (2013.01);
Abstract

A radiation delivery system includes a multi-leaf collimator (MLC) that includes a housing, a plurality of leaves disposed within the housing, and an image sensor disposed within the housing at a position that is offset from a beam axis. The plurality of leaves are movable to define an aperture for the MLC, and the image sensor is directed toward the plurality of leaves. The image sensor is to generate an oblique-view image of the aperture. The radiation delivery system additionally includes a processing device to receive the oblique-view image, transform the oblique-view image into a top-view image having a reference coordinate space, and determine whether the aperture for the MLC corresponds to a specified aperture based on the top-view image.


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