The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 24, 2018

Filed:

Apr. 21, 2014
Applicant:

Ta-lun Tan, Taipei, TW;

Inventor:

Ta-Lun Tan, Taipei, TW;

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 17/56 (2006.01); A61B 17/72 (2006.01); A61B 17/17 (2006.01); A61B 90/00 (2016.01);
U.S. Cl.
CPC ...
A61B 17/7233 (2013.01); A61B 17/1725 (2013.01); A61B 90/39 (2016.02); A61B 17/72 (2013.01); A61B 2017/564 (2013.01);
Abstract

In one aspect of the disclosure, an intramedullary (IM) apparatus for treating a fractured bone of an animal includes an IM nail elongated along a longitudinal axis and having at least three locking holes equally distantly defined thereon along the longitudinal axis, and a positional reference member having a longitudinal vernier scale thereon. The IM nail is configured to be inserted to a medullary cavity of a bone fragment, such that the IM nail is fixable to the bone fragment by a locking member correspondingly inserted into one of the locking holes through the bone fragment. The positional reference member is configured to be detachably mounted to the IM nail by two positioning members inserted into two of the locking holes such that the longitudinal vernier scale is parallel to the longitudinal axis of the IM nail, and each of the locking holes is locatable by the longitudinal vernier scale.


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