The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 24, 2018
Filed:
Dec. 22, 2015
Sharp Laboratories of America (Sla), Inc., Camas, WA (US);
Themistokles Afentakis, Camas, WA (US);
Sharp Laboratories of America, Inc., Camas, WA (US);
Abstract
A method is provided for making multiple environmental measurements using a single sensing element. Each sensing element (sensel) includes a thin-film transistor (TFT) and a passive element. Typically, a plurality of sensels is provided arranged into an array. In response to an electrical stimulus, an electrical measurement is supplied that is responsive to a change in TFT electrical characteristic correlated to a first environmental condition, as well as a change in a characteristic of the passive element correlated to a second environmental condition. When the sensels are formed in an array, a plurality of electrical measurements is supplied corresponding plurality of locations on a monitored surface. Some exemplary environmental conditions include temperature, pressure, moisture, chemicals, oxygen, solution pH, salinity, and shear. The method determines the first environmental condition independent of the second environmental condition, while determining the second environmental condition independent of the first environmental condition.