The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 24, 2018

Filed:

Oct. 27, 2017
Applicant:

Original, Inc., San Francisco, CA (US);

Inventor:

Chong Jin Koh, San Francisco, CA (US);

Assignee:

Original, Inc., San Francisco, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A41H 1/00 (2006.01); A41H 3/00 (2006.01); G05B 19/4097 (2006.01); G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
A41H 3/007 (2013.01); G05B 19/4097 (2013.01); G06F 17/50 (2013.01); G05B 2219/35134 (2013.01);
Abstract

Disclosed are methods and systems for generating a customized garment design. The method, when executed by a processor, comprises first receiving user data, generating at least one user signal, identifying a preferred garment category by analyzing the user data, retrieving related third-party data and public data, and retrieving features for the identified garment category from a database. For features associated with cuts and fabrics, preferred cut values and preferred fabric values are identified based on previously received data, and corresponding value scores computed. For other features, preferred feature values are identified, and corresponding value scores computed. One or more feature sets are generated by selecting a preferred value for each feature, where an associated feature set score is computed based on the value scores and one or more score adjustments. A customized garment design is generated by selecting a feature set with a high feature set score.


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