The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 2018
Filed:
Nov. 30, 2015
Applicant:
Rohde & Schwarz Gmbh & Co. KG, Munich, DE;
Inventors:
Assignee:
Rohde & Schwarz GmbH & Co. KG, Munich, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 1/00 (2006.01); H04W 24/08 (2009.01); H04W 56/00 (2009.01); H04W 76/04 (2009.01); H04B 17/18 (2015.01); H04W 84/12 (2009.01); H04W 88/02 (2009.01); H04W 88/08 (2009.01);
U.S. Cl.
CPC ...
H04W 24/08 (2013.01); H04B 17/18 (2015.01); H04W 56/001 (2013.01); H04W 76/04 (2013.01); H04W 84/12 (2013.01); H04W 88/02 (2013.01); H04W 88/08 (2013.01);
Abstract
A test system for testing a plurality of devices under test (DUTs) is provided. The test system comprises a test signal generator configured to generate test signals to be transmitted to the DUTs, wherein the test signals comprise at least one synchronization signal. The test signal generator is configured to broadcast the at least one synchronization signal to the DUTs. It is thereby possible to simultaneously test more than one DUT.