The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 2018
Filed:
Mar. 23, 2017
Olympus Corporation, Hachioji-shi, Tokyo, JP;
National University Corporation Chiba University, Chiba-shi, Chiba, JP;
OLYMPUS CORPORATION, Tokyo, JP;
NATIONAL UNIVERSITY CORPORATION CHIBA UNIVERSITY, Chiba-Shi, Chiba, JP;
Abstract
An image processing apparatus is intended to find, even when shooting a subject having a depth, respective reflection characteristics of portions of the subject with high accuracy, and includes a high-luminance region extraction unit which extracts high-luminance regions having a higher luminance than a predetermined threshold value in a plurality of image signals obtained by irradiating the subject with light emitted from a known light source and shooting reflected light from the subject at a plurality of viewpoints, a local region extraction unit which extracts local regions respectively most focused on in the portions of the subject using the plurality of high-luminance regions, and a reflection characteristic estimation unit which estimates a reflection characteristic of the subject using respective light source characteristics of the high-luminance regions in the local regions.