The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 17, 2018

Filed:

Apr. 30, 2015
Applicant:

Vmware, Inc., Palo Alto, CA (US);

Inventors:

Mazda A. Marvasti, Coto de Caza, CA (US);

Ashot Nshan Harutyunyan, Yerevan, AM;

Naira Movses Grigoryan, Yerevan, AM;

Arnak Poghosyan, Yerevan, AM;

Assignee:

VMware, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 12/26 (2006.01); H04L 29/08 (2006.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
H04L 43/04 (2013.01); G06F 11/34 (2013.01); H04L 43/08 (2013.01); H04L 67/1097 (2013.01);
Abstract

Methods and systems that manage large volumes of metric data generation by cloud-computing infrastructures are described. The cloud-computing infrastructure generates sets of metric data, each set of metric data may represent usage or performance of an application or application module run by the cloud-computing infrastructure or may represent use or performance of cloud-computing resources used by the applications. The metric data management methods and systems are composed of separate modules that perform sequential application of metric data reduction techniques on different levels of data abstraction in order to reduce volume of metric data collected. In particular, the modules determine normalcy bounds, delete highly correlated metric data, and delete metric data with highly correlated normalcy bound violations.


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