The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 17, 2018

Filed:

Jul. 15, 2016
Applicant:

Samsung Electronics Co., Ltd., Gyeonggi-do, KR;

Inventors:

Sangwook Han, Seoul, KR;

Thomas Byunghak Cho, Gyeonggi-do, KR;

Jaehyun Lim, Seoul, KR;

Sung-Jun Lee, Gyeonggi-do, KR;

Joonhee Lee, Gyeonggi-do, KR;

Jongwon Choi, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03L 5/00 (2006.01); H03K 19/0175 (2006.01); H01L 27/02 (2006.01);
U.S. Cl.
CPC ...
H03K 19/017509 (2013.01); H01L 27/0248 (2013.01);
Abstract

An integrated circuit (IC), a method of testing the IC, and a method of manufacturing the IC are provided. The IC includes analog circuitry, digital circuitry, at least one first connector, and a switching unit operatively coupled with the at least one first connector and configured to, if a first signal is received, couple the analog circuitry and the at least one first connector, and, if a second signal is received, couple the digital circuitry and the at least one first connector.


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