The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 17, 2018

Filed:

Nov. 10, 2016
Applicant:

Micromass Uk Limited, Wilmslow, GB;

Inventors:

Jeffrey Mark Brown, Hyde, GB;

Paul Murray, Manchester, GB;

Assignee:

MICROMASS UK LIMITED, Wilmslow, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/40 (2006.01); H01J 49/24 (2006.01); H01J 49/06 (2006.01); H01J 49/00 (2006.01); H01J 49/04 (2006.01); H01J 49/16 (2006.01);
U.S. Cl.
CPC ...
H01J 49/061 (2013.01); H01J 49/0027 (2013.01); H01J 49/0495 (2013.01); H01J 49/164 (2013.01); H01J 49/40 (2013.01);
Abstract

A mass spectrometer includes: an ion source; an aperture; a flight region arranged between the ion source and aperture for separating ions according to their mass to charge ratio; and ion optics arranged and configured for causing ions to be reflected or deflected while they separate according to mass to charge ratio in the flight region and such that the ions are focussed to a geometrical focal point at the aperture so that the ions are transmitted through the aperture. The multi-reflecting or multi-deflecting ion optics provides a relatively long flight path for the ions, while naturally converging the ion beam to a focus. As this focus is arranged at the aperture, it enables the aperture to be made relatively small while still maintaining high ion transmission efficiency.


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