The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 17, 2018

Filed:

Jul. 20, 2015
Applicants:

Boe Technology Group Co., Ltd., Beijing, CN;

Beijing Boe Optoelectronics Technology Co., Ltd., Beijing, CN;

Inventors:

Chong Liu, Beijing, CN;

Tielin Zhang, Beijing, CN;

Haisheng Zhao, Beijing, CN;

Zhilong Peng, Beijing, CN;

Huanping Liu, Beijing, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G09G 3/00 (2006.01); G09G 3/36 (2006.01);
U.S. Cl.
CPC ...
G09G 3/006 (2013.01); G09G 3/3648 (2013.01); G09G 2300/0426 (2013.01); G09G 2330/12 (2013.01);
Abstract

The present invention provides an array substrate and a detecting method therefor, a display panel and a display device. The array substrate comprises a plurality of data lines, a plurality of short circuit rings respectively provided at ends of the plurality of data lines, and a common wire connecting the plurality of short circuit rings in series, wherein, a switch unit is provided between the end of each data line and the corresponding short circuit ring, and the switch unit is configured to disconnect the data line with the corresponding short circuit ring in a testing stage. The present invention can improve the detection rate and accuracy rate in an array test.


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