The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 17, 2018

Filed:

Aug. 26, 2016
Applicant:

Elekta, Inc., Atlanta, GA (US);

Inventors:

Jiaofeng Xu, St. Louis, MO (US);

Xiao Han, Chesterfiled, MO (US);

Assignee:

ELEKTA, INC., Atlanta, GA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2017.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0081 (2013.01); G06K 9/6269 (2013.01); G06T 7/0012 (2013.01); G06T 2207/10012 (2013.01); G06T 2207/10081 (2013.01); G06T 2207/10088 (2013.01); G06T 2207/30004 (2013.01);
Abstract

The present disclosure relates to systems, methods, devices, and non-transitory computer-readable storage medium for segmenting three-dimensional images. In one implementation, a computer-implemented method for segmenting a three-dimensional image is provided. The method may include receiving a three-dimensional image acquired by an imaging device, and selecting a plurality of stacks of adjacent two-dimensional images from the three-dimensional image. The method may further include segmenting, by a processor, each stack of adjacent two-dimensional images using a neural network model. The method may also include determining, by the processor, a label map for the three-dimensional image by aggregating the segmentation results from the plurality of stacks.


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