The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 17, 2018

Filed:

Jul. 27, 2016
Applicants:

Michael Bleyer, Seattle, WA (US);

Raymond Kirk Price, Redmond, WA (US);

Jian Zhao, Kenmore, WA (US);

Denis Claude Pierre Demandolx, Bellevue, WA (US);

Inventors:

Michael Bleyer, Seattle, WA (US);

Raymond Kirk Price, Redmond, WA (US);

Jian Zhao, Kenmore, WA (US);

Denis Claude Pierre Demandolx, Bellevue, WA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 15/04 (2011.01); G06T 7/00 (2017.01); G06T 19/00 (2011.01);
U.S. Cl.
CPC ...
G06T 7/0057 (2013.01); G06T 15/04 (2013.01); G06T 19/006 (2013.01); G06T 2215/16 (2013.01);
Abstract

Systems and methods are provided for determining a depth map and a reflectivity map from a structured light image. The depth map can be determined by capturing the structured light image and then using a triangulation method to determine a depth map based on the dots in the captured structured light image. The reflectivity map can be determined based on the depth map and based on performing additional analysis of the dots in the captured structured light image.


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