The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 17, 2018

Filed:

Nov. 04, 2015
Applicant:

Kofax, Inc., Irvine, CA (US);

Inventors:

Anthony Macciola, Irvine, CA (US);

Jiyong Ma, San Diego, CA (US);

Alexander Shustorovich, Pittsford, NY (US);

Christopher Thrasher, Rochester, NY (US);

Jan W. Amtrup, Silver Spring, MD (US);

Assignee:

KOFAX, INC., Irvine, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/52 (2006.01); G06T 3/00 (2006.01); G01B 11/14 (2006.01); G06T 7/60 (2017.01);
U.S. Cl.
CPC ...
G06K 9/52 (2013.01); G01B 11/14 (2013.01); G06T 3/00 (2013.01); G06T 7/60 (2013.01);
Abstract

In various embodiments, methods, systems, and computer program products for determining distance between an object and a capture device are disclosed. The distance determination techniques are based on image data captured by the capture device, where the image data represent the object. These techniques improve the function of capture devices such as mobile phones by enabling determination of distance using a single lens capture device, and based on intrinsic parameters of the capture device, such as focal length and scaling factor(s), in preferred approaches. In some approaches, the distance estimation may be based in part on a priori knowledge regarding size of the object represented in the image data. Distance determination may be based on a homography transform and/or reference image data representing the object, a same type or similar type of object, in more approaches.


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