The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 2018
Filed:
Mar. 06, 2017
Fujifilm Corporation, Tokyo, JP;
Yoshirou Yamazaki, Tokyo, JP;
FUJIFILM CORPORATION, Tokyo, JP;
Abstract
An image defect detection device that divides an original print image and a print image printed on the basis of the original print image into corresponding regions, acquires an image feature amount of each divided region, extracts a strength of a difference of each divided region between the original print image and the print image, calculates an image defect detection time indicating a time required to detect a defect of each divided region of the print image from the image feature amount and the strength of the difference of each divided region, calculates an expected image defect value indicating a possibility of presence of a defect in each divided region of the print image from the image feature amount and the strength of the difference of each divided region, determines an order of detection of the image defect of the divided region of the print image.