The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 2018
Filed:
Jan. 28, 2014
Applicant:
Nec Corporation, Minato-ku, Tokyo, JP;
Inventors:
Masahiro Tani, Tokyo, JP;
Osamu Houshuyama, Tokyo, JP;
Takafumi Koshinaka, Tokyo, JP;
Ryoma Oami, Tokyo, JP;
Hiroyoshi Miyano, Tokyo, JP;
Assignee:
NEC CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G10L 25/48 (2013.01); G01S 3/802 (2006.01); H04N 5/77 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00335 (2013.01); G01S 3/802 (2013.01); G06K 9/00778 (2013.01); G10L 25/48 (2013.01); H04N 5/772 (2013.01); H04N 5/77 (2013.01);
Abstract
A monitoring device includes a crowd behavior analysis unitand an abnormality degree calculation unit. The crowd behavior analysis unitspecifies a behavior pattern of a crowd from input video. The abnormality degree calculation unitcalculates an abnormality degree from a change of the behavior pattern.
Tani, Masahiro. (2018). Monitoring device, monitoring method and monitoring program (U.S. Patent No. 9946921). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9946921
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile