The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 2018
Filed:
Dec. 15, 2015
Applicant:
Craig B. Arnold, Princeton, NJ (US);
Inventor:
Craig B. Arnold, Princeton, NJ (US);
Assignee:
Other;
Primary Examiner:
Int. Cl.
CPC ...
G02B 27/09 (2006.01); G02F 1/11 (2006.01); G02B 21/06 (2006.01); G02B 21/02 (2006.01); G02B 3/00 (2006.01); G02B 25/00 (2006.01);
U.S. Cl.
CPC ...
G02B 27/0927 (2013.01); G02B 3/0081 (2013.01); G02B 3/0087 (2013.01); G02B 21/025 (2013.01); G02B 21/06 (2013.01); G02B 25/001 (2013.01); G02F 1/11 (2013.01); G02F 2203/18 (2013.01);
Abstract
An apparatus, system and method for microscopy. The apparatus, system and method includes a stage configured to receive an item; a tunable acoustic gradient index of refraction (TAG) lens having a first aspect positioned to image the received item, wherein the first aspect of the TAG lens is configured to have an optical power profile in accordance with an operational frequency of the TAG lens; one or more lenses configured to magnify an image of the received item at a viewing point; and at least one pulsed light source configured to illuminate the received item and to pulse at one or more points within the optical power profile of the TAG lens.