The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 2018
Filed:
Jun. 18, 2015
Nokia Technologies Oy, Espoo, FI;
Ruigang Yang, Lexington, KY (US);
Xin Chen, Evanston, IL (US);
Nokia Technologies Oy, Espoo, FI;
Abstract
An approach is provided for acquiring both depth and surface normal of an object using a time-of-flight sensor with multiple distributed light sources. The approach involves causing, at least in part, at least one sequential illumination of at least one object by a plurality of distributed light sources associated with a time-of-flight sensor. The approach also involves causing, at least in part, a capturing of reflected light intensity data using the time-of-flight sensor during the at least one sequential illumination. The approach further involves processing and/or facilitating a processing of the reflected light intensity data to determine at least one depth, at least one surface normal, or a combination thereof of the at least one object.