The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 2018
Filed:
May. 19, 2017
Harold Young Hwang, Cambridge, MA (US);
Jian LU, Medford, MA (US);
Yaqing Zhang, Cambridge, MA (US);
Benjamin K. Ofori-okai, Cambridge, MA (US);
Keith A. Nelson, Newton, MA (US);
Xian LI, Cambridge, MA (US);
Harold Young Hwang, Cambridge, MA (US);
Jian Lu, Medford, MA (US);
Yaqing Zhang, Cambridge, MA (US);
Benjamin K. Ofori-Okai, Cambridge, MA (US);
Keith A. Nelson, Newton, MA (US);
Xian Li, Cambridge, MA (US);
Massachusetts Institute of Technology, Cambridge, MA (US);
Abstract
A nonlinear terahertz (THz) spectroscopy technique uses a sample illuminated by two THz pulses separately. The illumination generates two signals Band B, corresponding to the first and second THz pulse, respectively, after interaction with the sample. The interaction includes excitation of at least one ESR transition in the sample. The sample is also illuminated by the two THz pulses together, with an inter-pulse delay τ, generating a third signal B. A nonlinear signal BNL is then derived via B=B−B−B. This nonlinear signal Bcan be then processed (e.g., Fourier transform) to study the properties of the sample.