The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9945745 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 17, 2018

Filed:

Jun. 17, 2014
Applicant:

Hino Motors, Ltd., Tokyo, JP;

Inventor:

Hitoshi Nakano, Hino, JP;

Assignee:

HINO MOTORS, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 13/00 (2006.01); F02D 41/22 (2006.01); F02B 29/04 (2006.01); G01M 15/14 (2006.01); F02D 41/18 (2006.01);
U.S. Cl.
CPC ...
G01L 13/00 (2013.01); F02B 29/0493 (2013.01); F02D 41/22 (2013.01); G01M 15/14 (2013.01); F02D 41/18 (2013.01); F02D 2200/0406 (2013.01); Y02T 10/146 (2013.01); Y02T 10/40 (2013.01);
Abstract

An anomaly determination system includes inlet and outlet pressure sensors for a pressure loss portion, an outside pressure sensor, and an anomaly determination section for determining an anomaly of the pressure loss portion. The anomaly determination section determines that the pressure loss portion is anomalous if the following two conditions are both met: a difference between the inlet pressure and the outlet pressure, a difference between the outlet pressure and the outside pressure, and a difference between the outside pressure and the inlet pressure which differences are detected when the flow rate is less than the minimum flow rate are all included in an allowable range; and a pressure difference between the inlet pressure and the outlet pressure when the flow rate is greater than or equal to the minimum flow rate is included in the first pressure loss range.


Find Patent Forward Citations

Nakano, Hitoshi. (2018). Anomaly determination system and anomaly determination method (U.S. Patent No. 9945745). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9945745

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