The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 2018
Filed:
Apr. 06, 2016
Mettler-toledo, Llc, Columbus, OH (US);
Norbert Hartwig, Waldems, DE;
Mettler-Toledo, LLC, Columbus, OH (US);
Abstract
A method of determining the mass of an object by scanning the object in a radiographic inspection system, specifically in an X-ray scanner with the capability to take scan images at a plural number J of energy leves, has three modes or parts, namely: an initial learning mode, a normal operating mode, and a learning improvement mode. An inintial learning mode in which refernce object are scanned and their actual masses weighed and stored as reference values. A normal operating mode wherein smaple objects with unknown mass m are scanned and analyzed for compatibility with the reference values, and if found incompatible, the method switches to the learning improvement mode. A learning improvement mode in which the actual mass of the sample object found incompatible is determined by weighing and updates the stored reference values.