The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 2018
Filed:
Sep. 24, 2014
Guangdong University of Technology, Guangzhou, CN;
Zhijun Yang, Guangzhou, CN;
Youdun Bai, Guangzhou, CN;
Xin Chen, Guangzhou, CN;
Jian Gao, Guangzhou, CN;
Haidong Yang, Guangzhou, CN;
Meng Wang, Guangzhou, CN;
GUANGDONG UNIVERSITY OF TECHNOLOGY, Guangzhou, CN;
Abstract
The present disclosure relates to a macro-micro composite grating ruler measuring system based on conversion and amplification in vertical and horizontal directions. The macro-micro composite grating ruler includes a grating ruler, a macro-micro reading system moving with respect to the grating ruler, and a counting and image processing module. The macro-micro reading system faces grating strip datum and is parallel to the grating ruler. The system further includes a measuring reference line. The measuring reference line obtained by the image sensor together with grating strips forms an image overlap in the counting and image processing module. The measuring reference line and the grating strip jointly include an angle θ. With the foregoing configuration, the present invention is compatible with the existing incremental grating rulers and absolute grating rulers, so is highly applicable.