The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 2018
Filed:
Feb. 26, 2015
Ixblue, Saint-Germain-en-Laye, FR;
Herve Lefevre, Paris, FR;
Frederic Guattari, Aubervilliers, FR;
Cedric Molucon, Saint Germain en Laye, FR;
Stephane Chouvin, Bagneux, FR;
IXBLUE, Saint-Germain-en-Laye, FR;
Abstract
Interferometric measurement device includes a light source emitting a source signal and optical coupling elements receiving the source signal, directing part of the latter towards a measurement pathway including a Sagnac ring interferometer, of frequency f, producing a power output signal Ppolarized according to a first polarization direction, tapping off another part of the source signal towards a compensation pathway producing a return power compensation signal P, and directing the output and compensation signals towards detection elements. The compensation pathway includes polarization rotation elements producing the compensation signal according to a second cross-direction of polarization, and optical looping elements redirecting part of the compensation signal towards the measurement pathway; the detection elements include a single detector connected to the coupling elements for receiving the output signal and the compensation signal; the device further includes power equilibration elements equalizing the output power and/or return power are routed towards the detector.